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 | P. Rai-Choudhury - 1997 - 496 pages
...estimated to be about 50 to 200nm assuming B-mode defects and grown-in defects are the same. References 1 . J. Ryuta, E. Morita, T. Tanaka and Y. Shimanuki, Jpn. J. Appl. Phys., 29, LI 947 (1990). 2. T. Shiota, E. Morita, J. Furukawa, H. Furuya, T. Shingyouji and Y. Shimanuki, Proc.... | |
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 | Takao Abe - 1999 - 548 pages
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 | Cor L. Claeys - 2002 - 428 pages
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 | Howard R. Huff, László Fábry, Seigo Kishino - 2002 - 650 pages
...without void defect. REFERENCES 1. H. Suga, Ext. Abstract 92-2, The Electrochem. Soc. Meeting (1992). 2. J. Ryuta, E. Morita, T. Tanaka and Y. Shimanuki, Jpn. J. Appl. Phys., 31, L293 (1992). 3. H. Nishikawa, M. Tanaka, T. Ono and M. Horai, Jpn. J. Appl. Phys., 36, 6595 (1997).... | |
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...Dornberger, W. von Ammon, J. Virbulis, B. Hanna and T. Sinno, J, Crystal Growth, 230, (2001) 291. 53. J. Ryuta, E. Morita, T. Tanaka and Y. Shimanuki, Jpn. J. Appl. Phys., 31, (1992) L293. 54. D. Graf, M. Suhren, U. Lambert, R. Schmolke, A. Ehlert, W. von Ammon and P. Wagner,... | |
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J. Ryuta, E. Morita, T. Tanaka, and Y. Shimanuki, Jpn. J. Appl. Phys. 29, L1947 (1990). 