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" S. Takagi, A. Toriumi. M. Iwase, and H. Tango. "On the universality of inversion layer mobility in Si MOSFET's: Part I — effects of substrate impurity concentration, "
ULSI Science and Technology/1997: Proceedings of the Sixth International ... - Page 607
edited by - 1997 - 664 pages
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Advanced Physical Models for Silicon Device Simulation

Andreas Schenk - 1998 - 384 pages
...Abstracts of the Int. Conf. on Solid State Devices and Materials, Sendai, Japan, pp. 275-78, 1990. [1.291] S. Takagi, A. Toriumi, M. Iwase, and H. Tango. On the Universality of Inversion Layer Mobility in Si MOSFETs. IEEE Trans. Electron Devices, 41(12):2357-68, 1994. [1.292] Y. Takahashi. M. Nagase, H. Namatsu,...
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Essderc'98

1998 - 680 pages
...roughness at the Si(lOO)SiO2 interface", Phys. Rev. B, 32(12):8171 -8186,1985. [11] S. Takagi, A. Torimuri, and H. Tango, "On the universality of inversion layer mobility in Si MOSFET's", IEEE Trans. El. Dev., 41(12):2357- 2362, 1994. [12] Deepak K. Nayak, K. Goto, A. Yutani, J. Murota,...
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Hierarchical Device Simulation: The Monte-Carlo Perspective

Christoph Jungemann, Bernd Meinerzhagen - 2003 - 282 pages
..."A new current relation for hot electron transport", in Proc. NASECODE IV, 1985, pp. 311-314. [9.66] S. Takagi, A. Toriumi, M. Iwase, and H. Tango, "On...impurity concentration", IEEE Trans. Electron Devices, vol. 41, pp. 2357-2362, 1994. [9.67] .1.A. Cooper and DFNelson, "High-field drift velocity of electrons...
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Simulation of Semiconductor Processes and Devices 2004: Sispad 2004

Gerhard Wachutka, Gabriele Schrag - 2004 - 420 pages
...Scattering in MOSFETs: Screening by Electrons in the Gate”, APL 83(23), pp. 4848—4850, (2003). [6] S. Takagi, A. Toriumi, M. Iwase, and H. Tango, “On...the Universality of Inversion Layer Mobility in Si MosFErs”, IEEE Trans. El. Dcv., ED-41 (12), pp. 2357—2368, 1994. on the Relationship Between Carrier...
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Matching Properties of Deep Sub-Micron MOS Transistors

Jeroen A. Croon, Willy M. C. Sansen, Herman E. Maes - 2005 - 222 pages
...concentration,” IEEE Transactions on Electron Devices, vol. 41, no. 12, pp. 2357— 2362, 1994. [56] 5. Takagi, A. Toriumi, M. Iwase, and H. Tango, “On...inversion layer mobility in Si MOSFET's: part I-effects of surface orientation,” IEEE Transactions on Electron Devices, vol. 41, no. 12, pp. 2363—2368, 1994....
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Leakage in Nanometer CMOS Technologies

Siva G. Narendra, Anantha P. Chandrakasan - 2006 - 308 pages
...Nanoscale CMOS. IEEE Transactions on Electron Devices 49-3, 436 (2002) 34 S. Takagi, A. Toriumi, M. Iwase, H. Tango: On the Universality of Inversion Layer Mobility in Si MOSFET's: Part II-Effects of Surface Orientation. IEEE Transactions on Electron Devices 41-12, 2362 (1994) 35 T. Sato,...
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Silicon Heterostructure Handbook: Materials, Fabrication, Devices, Circuits ...

John D. Cressler - 2018 - 1248 pages
...strained Si N- and pMOSFETs. Digest of Symposium on VLSI Technology, Honolulu, HI, 2002, pp. 98-99. 18. S Takagi, A Toriumi, M Iwase, and H Tango. On the universality of inversion layer mobility in Si MOSFETs: Part I — Effects of substrate impurity concentration. IEEE Transactions on Electron Devices...
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Low-Frequency Noise in Advanced MOS Devices

Martin Haartman, Mikael Östling - 2007 - 216 pages
...M. Lundstrom, Fundamentals of carrier transport (Cambridge University Press, Cambridge, 2000). 17. S. Takagi, A. Toriumi, M. Iwase, and H. Tango, On...impurity concentration, IEEE Trans. Electron Devices 41, 2357-2362 (1994). 18. SA Schwarz and SE Russek, Semi-empirical equations for electron velocity...
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Physics of Semiconductor Devices

Simon M. Sze, Kwok K. Ng - 2006 - 828 pages
...of the Electron Mobility in the Inverted (100) Si Surface," Tech. Dig. IEEE IEDM, p. 18, 1979. 33. S. Takagi, A. Toriumi, M. Iwase, and H. Tango, "On...Universality of Inversion Layer Mobility in Si MOSFET's: Part I— Effects of Substrate Impurity Concentration," IEEE Trans. Electron Dev., ED-41, 2357 (1994). 34....
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Silicon Heterostructure Devices

John D. Cressler - 2018 - 472 pages
...strained Si N- and pMOSFETs. Digest of Symposium on VLSI Technology, Honolulu, HI, 2002, pp. 98-99. 18. S Takagi, A Toriumi, M Iwase, and H Tango. On the universality of inversion layer mobility in Si MOSFETs: Part I — Effects of substrate impurity concentration. IEEE Transactions on Electron Devices...
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